AFM
Zentrum für organische Elektronik (ZOEK) gGmbH
TECHNICAL SERVICE
Components
[INSPECTION] Other
[R&D PROJECT / TECHNO TRANSFER / CONTRACT RESEARCH] Technology concept development (TRL 2) [R&D PROJECT / TECHNO TRANSFER / CONTRACT RESEARCH] Proof of concept (TRL3: Critical Function or Proof of Concept Established). [R&D PROJECT / TECHNO TRANSFER / CONTRACT RESEARCH] Specific R&D contract research [PROVIDER OF TECH INFRASTRUCTURE] Access to Lab facilities and services
Electronics & Components Other
Transport/Automotive Textile Sports Security Printing and graphic arts Packaging/Logistics Ligthing Health Environment Energy Consumer electronics Building & architecture
We offer Atomic Force Microscopy of surfaces.

Modell:

A) AIST-NT Inc.–SmartSPM

B) Asylum Research–MFP 3D

Limits:

A) size max. 40 x 50 mm², max. thickness 15 mm, contact, semi-contact, non-contact, phase imaging, lateral force, magnetic force, Kelvin probe, piezo response, nanolithography

B) size max. 80 x 80 mm2, max. thickness 10 mm, scan area max. 90 x 90 µm², contact & non-contact, topography, phase contrast, friction contrast, potential contrast, local conductivity, Kelvin probe, magnetic force, high voltage module, heating / cooling module